US Patent Application 18323969. METHOD FOR EVALUATING SENSOR DATA, COMPUTING UNIT FOR EVALUATING SENSOR DATA AND SENSOR SYSTEM simplified abstract
Contents
METHOD FOR EVALUATING SENSOR DATA, COMPUTING UNIT FOR EVALUATING SENSOR DATA AND SENSOR SYSTEM
Organization Name
Inventor(s)
[[:Category:Timo Heikkil� of Kusterdingen (DE)|Timo Heikkil� of Kusterdingen (DE)]][[Category:Timo Heikkil� of Kusterdingen (DE)]]
METHOD FOR EVALUATING SENSOR DATA, COMPUTING UNIT FOR EVALUATING SENSOR DATA AND SENSOR SYSTEM - A simplified explanation of the abstract
This abstract first appeared for US patent application 18323969 titled 'METHOD FOR EVALUATING SENSOR DATA, COMPUTING UNIT FOR EVALUATING SENSOR DATA AND SENSOR SYSTEM
Simplified Explanation
The abstract describes a method for evaluating sensor data in which raw or processed data from at least one sensor is inputted. Measurement data is determined from this inputted data and then corrected using a mathematical model. The correction process involves identifying and removing any drift in the sensor data. The corrected measurement data is then outputted.
- Method for evaluating sensor data
- Input raw or processed data from at least one sensor
- Determine measurement data from the inputted data
- Correct the measurement data using a mathematical model
- Identify and remove drift in the sensor data during the correction process
- Output the corrected measurement data
Original Abstract Submitted
A method for evaluating sensor data. In the method, firstly, raw sensor data and/or processed sensor data from at least one sensor are input and measurement data determined from the raw sensor data and/or the processed sensor data. The measurement data are then corrected on the basis of a mathematical model, wherein, on correction, drift of the raw sensor data and/or of the processed sensor data is determined and removed from the measurement data. The corrected measurement data are furthermore output.
