US Patent Application 18296300. INSPECTION SYSTEM, INSPECTION APPARATUS, CONTROL METHOD OF INSPECTION SYSTEM, AND CONTROL METHOD OF INSPECTION APPARATUS simplified abstract
INSPECTION SYSTEM, INSPECTION APPARATUS, CONTROL METHOD OF INSPECTION SYSTEM, AND CONTROL METHOD OF INSPECTION APPARATUS
Inventors
INSPECTION SYSTEM, INSPECTION APPARATUS, CONTROL METHOD OF INSPECTION SYSTEM, AND CONTROL METHOD OF INSPECTION APPARATUS - A simplified explanation of the abstract
- This abstract for appeared for patent application number 18296300 Titled 'INSPECTION SYSTEM, INSPECTION APPARATUS, CONTROL METHOD OF INSPECTION SYSTEM, AND CONTROL METHOD OF INSPECTION APPARATUS'
Simplified Explanation
The abstract describes an inspection apparatus that includes controllers with processors and memories. The controllers can receive an image to be used as a reference image and an inspection setting for that image. The apparatus can store the inspection setting and inspect a scanned image of a printed matter based on that setting. If a predetermined setting is received, the apparatus will reflect the associated inspection setting in the reference image.
Original Abstract Submitted
An inspection apparatus includes one or more controllers having one or more processors and one or more memories, the one or more controllers configured to function as a receiving unit configured to receive an image to be registered as a reference image, a reception unit configured to receive an inspection setting for the received reference image, a storage unit configured to store an inspection setting in a storage device, and an inspection unit configured to, if a scan image obtained by scanning of a printed matter is received, inspect the scan image based on the inspection setting, wherein, in a case where a predetermined setting is received by the reception unit, an inspection setting associated with the predetermined setting stored by the storage unit is reflected in the reference image.
