US Patent Application 18227712. SPACER STRUCTURES FOR SEMICONDUCTOR DEVICES simplified abstract
Contents
SPACER STRUCTURES FOR SEMICONDUCTOR DEVICES
Organization Name
Taiwan Semiconductor Manufacturing Company, Ltd.
Inventor(s)
Cheng-Yi Peng of Taipei City 112 (TW)
Song-Bor Lee of Zhubei City (TW)
SPACER STRUCTURES FOR SEMICONDUCTOR DEVICES - A simplified explanation of the abstract
This abstract first appeared for US patent application 18227712 titled 'SPACER STRUCTURES FOR SEMICONDUCTOR DEVICES
Simplified Explanation
The patent application describes a semiconductor device structure and a method of fabricating it.
- The semiconductor device includes a substrate, nanostructured layers, and source/drain (S/D) regions.
- The S/D regions have an epitaxial region wrapped around the nanostructured regions.
- The device also includes a gate-all-around (GAA) structure wrapped around the nanostructured regions.
- Inner spacers are placed between the S/D regions and the GAA structure.
- A passivation layer is applied to the sidewalls of the nanostructured regions.
- The innovation improves the performance and efficiency of the semiconductor device.
Original Abstract Submitted
The structure of a semiconductor device with inner spacer structures between source/drain (S/D) regions and gate-all-around structures and a method of fabricating the semiconductor device are disclosed. The semiconductor device includes a substrate, a stack of nanostructured layers with first and second nanostructured regions disposed on the substrate and first and second source/drain (S/D) regions disposed on the substrate. Each of the first and second S/D regions includes an epitaxial region wrapped around each of the first nanostructured regions. The semiconductor device further includes a gate-all-around (GAA) structure disposed between the first and second S/D regions and wrapped around each of the second nanostructured regions, a first inner spacer disposed between an epitaxial sub-region of the first S/D region and a gate sub-region of the GAA structure, a second inner spacer disposed between an epitaxial sub-region of the second S/D region and the gate sub-region of the GAA structure, and a passivation layer disposed on sidewalls of the first and second nanostructured regions