US Patent Application 18225053. MULTI-FACTOR CLOUD SERVICE STORAGE DEVICE ERROR PREDICTION simplified abstract

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MULTI-FACTOR CLOUD SERVICE STORAGE DEVICE ERROR PREDICTION

Organization Name

Microsoft Technology Licensing, LLC==Inventor(s)==

[[Category:Yong Xu of Beijing (CN)]]

[[Category:Qingwei Lin of Beijing (CN)]]

[[Category:Kaixin Sui of Beijing (CN)]]

MULTI-FACTOR CLOUD SERVICE STORAGE DEVICE ERROR PREDICTION - A simplified explanation of the abstract

This abstract first appeared for US patent application 18225053 titled 'MULTI-FACTOR CLOUD SERVICE STORAGE DEVICE ERROR PREDICTION

Simplified Explanation

- The patent application describes systems and techniques for predicting errors in multi-factor cloud service storage devices. - The method involves obtaining a set of storage device metrics and a set of computing system metrics. - A feature set is generated using these metrics, and it is validated by evaluating a validation training dataset. - Based on the validation, a modified feature set is created, and a storage device failure model is developed using this modified feature set. - The method also involves determining a storage device rating range by minimizing the cost of misclassification of a storage device. - Finally, a set of storage devices with a high probability of failure is identified and labeled.


Original Abstract Submitted

Systems and techniques for multi-factor cloud service storage device error prediction are described herein. A set of storage device metrics and a set of computing system metrics may be obtained. A feature set may be generated using the set of storage device metrics and the set of computing system metrics. Members of the feature set may be validated by evaluating a validation training dataset using the members of the feature set. A modified feature set may be created based on the validation. A storage device failure model may be created using the modified feature set. A storage device rating range may be determined by minimizing a cost of misclassification of a storage device. A set of storage devices to be labeled may be identified as having a high probability of failure.

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