US Patent Application 18216107. TIME-SERIES DATA ANALYSIS DEVICE, TIME-SERIES DATA ANALYSIS METHOD, AND NON-TRANSITORY COMPUTER READABLE MEDIUM STORING TIME-SERIES DATA ANALYSIS PROGRAM simplified abstract

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TIME-SERIES DATA ANALYSIS DEVICE, TIME-SERIES DATA ANALYSIS METHOD, AND NON-TRANSITORY COMPUTER READABLE MEDIUM STORING TIME-SERIES DATA ANALYSIS PROGRAM

Organization Name

Mitsubishi Electric Corporation


Inventor(s)

Takaaki Nakamura of Tokyo (JP)


TIME-SERIES DATA ANALYSIS DEVICE, TIME-SERIES DATA ANALYSIS METHOD, AND NON-TRANSITORY COMPUTER READABLE MEDIUM STORING TIME-SERIES DATA ANALYSIS PROGRAM - A simplified explanation of the abstract

  • This abstract for appeared for US patent application number 18216107 Titled 'TIME-SERIES DATA ANALYSIS DEVICE, TIME-SERIES DATA ANALYSIS METHOD, AND NON-TRANSITORY COMPUTER READABLE MEDIUM STORING TIME-SERIES DATA ANALYSIS PROGRAM'

Simplified Explanation

The abstract describes a device that analyzes time-series data. It includes several components such as a time-series data input unit, a parameter setting unit, a feature calculating unit, a probability density distribution calculating unit, and a parameter selecting unit. The device receives time-series data and sets a range for the window length of a time series subsequence. It then calculates a feature of the data for different window lengths within the range. The probability density distribution of the calculated feature is also calculated. Finally, a statistical feature of the probability density distribution is calculated for each window length, and a window length is selected based on this statistical feature.


Original Abstract Submitted

A time-series data analysis device, includes: a time-series data input unit to receive time-series data; a parameter setting unit to set a range of a window length of a time series subsequence in the time-series data; a feature calculating unit to calculate a feature of the time-series data for each of a plurality of window lengths within the range; a probability density distribution calculating unit to calculate a probability density distribution of the calculated feature for each of the plurality of window lengths; and a parameter selecting unit to calculate a statistical feature of the probability density distribution calculated for each of the plurality of window lengths and select a window length to be used from among the plurality of window lengths on the basis of the calculated statistical feature.

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