US Patent Application 18212265. MONITORING OPERATION OF ELECTRON BEAM ADDITIVE MANUFACTURING WITH PIEZOELECTRIC CRYSTALS simplified abstract
MONITORING OPERATION OF ELECTRON BEAM ADDITIVE MANUFACTURING WITH PIEZOELECTRIC CRYSTALS
Organization Name
Inventor(s)
Scott Alan Gold of Waynesville OH (US)
MONITORING OPERATION OF ELECTRON BEAM ADDITIVE MANUFACTURING WITH PIEZOELECTRIC CRYSTALS - A simplified explanation of the abstract
This abstract first appeared for US patent application 18212265 titled 'MONITORING OPERATION OF ELECTRON BEAM ADDITIVE MANUFACTURING WITH PIEZOELECTRIC CRYSTALS
Simplified Explanation
- The patent application describes a monitoring system for electron beam additive manufacturing systems. - The system includes measuring devices with piezoelectric crystals positioned inside the build chamber. - An analysis component is connected to the measuring devices and programmed to receive information about the crystal's frequency of oscillation. - During the formation of an article, any material collected on the measuring devices causes a detectable change in the crystal's frequency of oscillation. - This change can be used by the analysis component to identify potential build anomalies in the article.
Original Abstract Submitted
Devices, systems, methods, and kits of parts for monitoring operation of an electron beam additive manufacturing systems are disclosed. A monitoring system includes one or more measuring devices positioned on the at least one wall in the interior of a build chamber of the additive manufacturing system. Each one of the one or more measuring devices includes a piezoelectric crystal. The monitoring system further includes an analysis component communicatively coupled to the one or more measuring devices. The analysis component is programmed to receive information pertaining to a frequency of oscillation of the piezoelectric crystal. A collection of material on the one or more measuring devices during formation of an article within the build chamber causes a change to the frequency of oscillation of the piezoelectric crystal that is detectable by the analysis component and usable to determine a potential build anomaly of the article.
