US Patent Application 18208923. DISPLAY DEVICE AND AN INSPECTION METHOD OF A DISPLAY DEVICE simplified abstract
Contents
DISPLAY DEVICE AND AN INSPECTION METHOD OF A DISPLAY DEVICE
Inventors
Bong Im Park of Hwaseong-si (KR)
DISPLAY DEVICE AND AN INSPECTION METHOD OF A DISPLAY DEVICE - A simplified explanation of the abstract
- This abstract for appeared for US patent application number 18208923 Titled 'DISPLAY DEVICE AND AN INSPECTION METHOD OF A DISPLAY DEVICE'
Simplified Explanation
The abstract describes a display device that consists of a display panel, a first substrate attached to one side of the display panel, and a second substrate attached to the first substrate. The display panel has two test pads called the first panel test pad and the second panel test pad. The first substrate has three circuit test leads called the 1-1 circuit test lead, the 1-2 circuit test lead, and the 2-1 circuit test lead. The 1-1 circuit test lead is connected to and overlaps with the first panel test pad, the 1-2 circuit test lead is connected to and overlaps with the second panel test pad, and the 2-1 circuit test lead is connected to and overlaps with the second substrate. There are three test lead lines called the 1-1 test lead line, the 1-2 test lead line, and the first test lead line. The 1-1 test lead line is connected to the 1-1 circuit test lead, the 1-2 test lead line is connected to the 1-2 circuit test lead, and the first test lead line is connected to the 2-1 circuit test lead. Finally, the 1-1 test lead line and the 1-2 test lead line are connected to the first test lead line.
Original Abstract Submitted
A display device including: a display panel; a first substrate attached to a side of the display panel; and a second substrate attached to a side of the first substrate, wherein the display panel includes a first panel test pad and a second panel test pad, the first substrate includes a 1-1 circuit test lead overlapping and connected to the first panel test pad, a 1-2 circuit test lead overlapping and connected to the second panel test pad, a 2-1 circuit test lead overlapping and connected to the second substrate, a 1-1 test lead line connected to the 1-1 circuit test lead, a 1-2 test lead line connected to the 1-2 circuit test lead, and a first test lead line connected to the 2-1 circuit test lead, and the 1-1 test lead line and the 1-2 test lead line are connected to the first test lead line.