US Patent Application 18204080. METHOD FOR DETECTING OUTLIER AND SYSTEM THEREOF simplified abstract
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Contents
METHOD FOR DETECTING OUTLIER AND SYSTEM THEREOF
Organization Name
Inventor(s)
METHOD FOR DETECTING OUTLIER AND SYSTEM THEREOF - A simplified explanation of the abstract
This abstract first appeared for US patent application 18204080 titled 'METHOD FOR DETECTING OUTLIER AND SYSTEM THEREOF
Simplified Explanation
The patent application describes a method for detecting outliers using a computing system.
- The method involves estimating two distributions: one for a given sample set and another for a target sample.
- An outlier score is calculated for the target sample based on the difference between the two distributions.
- The method aims to identify data points that deviate significantly from the expected distribution.
- This innovation can be used in various applications such as anomaly detection, fraud detection, and quality control.
- The method provides a quantitative measure to identify outliers, allowing for more accurate and efficient analysis of data.
Original Abstract Submitted
Provided is a method performed by a computing system for detecting an outlier. The method comprises estimating a first distribution for a given sample set, estimating a second distribution for a target sample, and calculating an outlier score of the target sample for the given sample set based on a difference between the first distribution and the second distribution.
