US Patent Application 18180873. SPATTER DETECTION METHOD simplified abstract

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SPATTER DETECTION METHOD

Organization Name

Honda Motor Co., Ltd.

Inventor(s)

Xihao Tan of Tokyo (JP)

Hitoshi Saito of Tokyo (JP)

Shinya Watanabe of Tokyo (JP)

SPATTER DETECTION METHOD - A simplified explanation of the abstract

This abstract first appeared for US patent application 18180873 titled 'SPATTER DETECTION METHOD

Simplified Explanation

The patent application describes a spot welding method using a welding apparatus.

  • The method involves supplying a pulse-shaped welding current to a workpiece.
  • The welding current is generated by a welding power circuit that alternately repeats power distribution control and a power distribution pause over multiple cycles.
  • The welding current is maintained within a set peak current range in a peak holding section under the power distribution control.
  • The patent also includes a spatter detection method.
  • The method involves acquiring the average value of voltage detection values detected by a voltage sensor in the peak holding section for each cycle.
  • Based on the difference value between the average values of voltage detection values in consecutive cycles, the method determines whether or not spatter occurs during the welding process.


Original Abstract Submitted

A spot welding method using a welding apparatus includes supplying a pulse-shaped welding current to a workpiece, the pulse-shaped welding current being generated when a welding power circuit alternately repeats power distribution control and a power distribution pause over a plurality of cycles, and maintaining, under the power distribution control, the welding current within a set peak current range in a peak holding section. A spatter detection method includes: a step of acquiring an average value of voltage detection values Vpv detected by a voltage sensor in the peak holding section for each of the cycles; and a step of determining whether or not the spatter occurs, based on a difference value between an average value of the voltage detection values Vpv in the peak holding section for an N-th cycle and an average value of the voltage detection values Vpv in the peak holding section for an (N−1)-th cycle.