US Patent Application 18136251. MEASUREMENT OPPORTUNITY SHARING FOR LAYER ONE MEASUREMENTS simplified abstract
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MEASUREMENT OPPORTUNITY SHARING FOR LAYER ONE MEASUREMENTS
Organization Name
Inventor(s)
Dawei Zhang of Saratoga CA (US)
Manasa Raghavan of Sunnyvale CA (US)
Xiang Chen of Campbell CA (US)
MEASUREMENT OPPORTUNITY SHARING FOR LAYER ONE MEASUREMENTS - A simplified explanation of the abstract
- This abstract for appeared for US patent application number 18136251 Titled 'MEASUREMENT OPPORTUNITY SHARING FOR LAYER ONE MEASUREMENTS'
Simplified Explanation
The abstract above describes a technology that allows for the sharing of measurement opportunities in wireless networks. This technology includes devices, components, systems, and methods that enable the sharing of Layer 1 measurements.
Original Abstract Submitted
The present application relates to devices and components including apparatus, systems, and methods for sharing Layer 1 measurement opportunities in wireless networks.
