US Patent Application 18114519. METHOD OF INSPECTING DISPLAY APPARATUS AND APPARATUS FOR INSPECTING DISPLAY APPARATUS simplified abstract
METHOD OF INSPECTING DISPLAY APPARATUS AND APPARATUS FOR INSPECTING DISPLAY APPARATUS
Organization Name
Inventor(s)
Jaechul Hong of Yongin-si (KR)
Sungyong Byeon of Yongin-si (KR)
METHOD OF INSPECTING DISPLAY APPARATUS AND APPARATUS FOR INSPECTING DISPLAY APPARATUS - A simplified explanation of the abstract
This abstract first appeared for US patent application 18114519 titled 'METHOD OF INSPECTING DISPLAY APPARATUS AND APPARATUS FOR INSPECTING DISPLAY APPARATUS
Simplified Explanation
- The patent application describes a method for inspecting a display apparatus. - The method involves using a display substrate with a display area and a current inspection area. - The current inspection area includes a first electrode and a second electrode that are separated from each other in a lengthwise direction of the substrate. - A first layer is also present in the current inspection area, which electrically connects the first electrode to the second electrode. - The method further involves applying a first voltage to the first electrode and a second voltage to the second electrode. - The current value flowing through the first layer is then measured. - The purpose of this method is to inspect the display apparatus, likely to ensure proper functioning or identify any issues. - The method provides a means to measure the current flowing through the first layer, which can be indicative of the performance of the display apparatus.
Original Abstract Submitted
A method of inspecting a display apparatus includes providing a display substrate including a substrate including a display area and a current inspection area, a first electrode and a second electrode that are disposed in the current inspection area and are apart from each other in a lengthwise direction of the substrate, and a first layer disposed in the current inspection area and electrically connecting the first electrode to the second electrode, and applying a first voltage and a second voltage to the first electrode and the second electrode, respectively, and measuring a current value flowing through the first layer.
