US Patent Application 18071021. IMAGE SENSOR TEST SYSTEM simplified abstract
Contents
IMAGE SENSOR TEST SYSTEM
Organization Name
Inventor(s)
Seongkwan Lee of Suwon-si (KR)
Cheolmin Park of Suwon-si (KR)
IMAGE SENSOR TEST SYSTEM - A simplified explanation of the abstract
This abstract first appeared for US patent application 18071021 titled 'IMAGE SENSOR TEST SYSTEM
Simplified Explanation
The patent application describes an image sensor test system.
- The system includes a test device and a probe card.
- The test device transmits an input signal and a control signal to at least one image sensor through the probe card.
- An interface board is used to connect the probe card and the test device.
- The interface board maps the connections between the probe card and the test device.
- The interface board includes a signal receiver.
- The signal receiver receives an image signal from the image sensor.
- The image signal is amplified by an operational amplifier in the signal receiver.
- A low-frequency attenuator is connected to the output terminal of the operational amplifier.
- The amplified image signal is outputted to the test device.
Original Abstract Submitted
An image sensor test system includes a test device configured to transmit an input signal and a control signal to at least one image sensor through a probe card, and an interface board configured to map the probe card and the test device to each other. The interface board includes a signal receiver configured to receive an image signal from the at least one image sensor, amplify the image signal, and output the image signal to the test device, and the signal receiver includes an operational amplifier configured to amplify the image signal, and a low-frequency attenuator connected to an output terminal of the operational amplifier.
