US Patent Application 18026693. IMAGE ANALYSIS DEVICE AND IMAGE ANALYSIS METHOD simplified abstract

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IMAGE ANALYSIS DEVICE AND IMAGE ANALYSIS METHOD

Organization Name

NEC Corporation


Inventor(s)

Taichi Tanaka of Tokyo (JP)


IMAGE ANALYSIS DEVICE AND IMAGE ANALYSIS METHOD - A simplified explanation of the abstract

  • This abstract for appeared for US patent application number 18026693 Titled 'IMAGE ANALYSIS DEVICE AND IMAGE ANALYSIS METHOD'

Simplified Explanation

The abstract describes an image analysis device that performs calculations on multiple images of the same region. It includes a complex matrix calculation unit that calculates a matrix reflecting the phase difference between pairs of images. A parameter candidate selection unit selects multiple potential parameters that could explain the phase shift. A candidate evaluation unit then assesses the likelihood of these candidates using the complex matrix and a weight matrix. Finally, a statistics calculation unit weights the parameter candidates based on their likelihood and calculates statistics for them.


Original Abstract Submitted

The image analysis device includes a complex matrix calculation unit which calculates a complex matrix that reflects a phase difference in all pairs of images in multiple images in which a same region is recorded, a parameter candidate selection unit which selects multiple candidates of parameter which explains a phase shift, a candidate evaluation unit which evaluates likelihood of the multiple candidates using the complex matrix and a predetermined weight matrix, and a statistics calculation unit which weights the candidates of parameter by the likelihood and calculates statistics of the candidates of parameter.