US Patent Application 18026026. MEASUREMENT DEVICE, INFORMATION PROCESSING DEVICE, POSITION ADJUSTMENT METHOD, AND COMPUTER-READABLE MEDIUM simplified abstract

From WikiPatents
Jump to navigation Jump to search

MEASUREMENT DEVICE, INFORMATION PROCESSING DEVICE, POSITION ADJUSTMENT METHOD, AND COMPUTER-READABLE MEDIUM

Organization Name

NEC Corporation


Inventor(s)

Jiro Abe of Tokyo (JP)

MEASUREMENT DEVICE, INFORMATION PROCESSING DEVICE, POSITION ADJUSTMENT METHOD, AND COMPUTER-READABLE MEDIUM - A simplified explanation of the abstract

This abstract first appeared for US patent application 18026026 titled 'MEASUREMENT DEVICE, INFORMATION PROCESSING DEVICE, POSITION ADJUSTMENT METHOD, AND COMPUTER-READABLE MEDIUM

Simplified Explanation

- The patent application describes a measurement device that acquires point cloud data at different measurement positions. - The device determines a rotation axis to adjust the position of the acquired data. - Based on the rotation axis, the first and second point cloud data, an evaluation function is determined to represent the desirability of the positional adjustment result. - The device calculates a positional adjustment parameter that optimizes the evaluation function. - The innovation aims to improve the accuracy and efficiency of positional adjustment in measurement devices.


Original Abstract Submitted

A measurement device acquires first point cloud data at a first measurement position and second point cloud data at a second measurement position; determines a rotation axis for positional adjustment; determines, based on the rotation axis, the first point cloud data, and the second point cloud data, an evaluation function indicating a region that is a union set of one or more columnar bodies as an evaluation function representing desirability of a positional adjustment result; and calculates a positional adjustment parameter that optimizes the evaluation function based on the rotation axis, the first point cloud data, and the second point cloud data.