US Patent Application 18024595. MULTI-MATERIAL DECOMPOSITION FOR SPECTRAL COMPUTED TOMOGRAPHY simplified abstract

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MULTI-MATERIAL DECOMPOSITION FOR SPECTRAL COMPUTED TOMOGRAPHY

Organization Name

KONINKLIJKE PHILIPS N.V.


Inventor(s)

LUDMILA Natanzon of HAIFA (IL)

LIRAN Goshen of PARDES-HANNA (IL)

MULTI-MATERIAL DECOMPOSITION FOR SPECTRAL COMPUTED TOMOGRAPHY - A simplified explanation of the abstract

This abstract first appeared for US patent application 18024595 titled 'MULTI-MATERIAL DECOMPOSITION FOR SPECTRAL COMPUTED TOMOGRAPHY

Simplified Explanation

- The patent application describes a computer system and method for spectral-data based material decomposition. - The system includes a statistical module that fits probability distributions to vector spectral diagrams for each patch in the input spectral imagery. - The input spectral imagery is obtained using a spectral imaging apparatus. - The probability distributions can be combined to create a probability map that shows the probabilities of different material types at each location in the input spectral imagery.

  • Computer system and method for spectral-data based material decomposition
  • Statistical module fits probability distributions to vector spectral diagrams for each patch in the input spectral imagery
  • Input spectral imagery is obtained using a spectral imaging apparatus
  • Probability distributions can be combined to create a probability map indicating material type probabilities at each location in the input spectral imagery.


Original Abstract Submitted

A computer system (MD) and relates method for spectral-data based material decomposition. The system comprises a statistical module (SM) configured to fit, per patch in input spectral imagery, a set of probability distributions (Pk) to a respective vector spectral diagram (5) for the respective patch (A). The patch is one of a plurality of patches in the input spectral imagery obtained by operation of a spectral imaging apparatus. The probability distributions are combinable into a probability map indicative of material type probabilities per image location in the input spectral imagery.

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