US Patent Application 18022105. TARGET ANALYZER, TARGET ANALYSIS METHOD, AND TARGET ANALYSIS SYSTEM simplified abstract

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TARGET ANALYZER, TARGET ANALYSIS METHOD, AND TARGET ANALYSIS SYSTEM

Organization Name

NEC Corporation


Inventor(s)

Kenji Miyazaki of Tokyo (JP)


Munehisa Kamio of Tokyo (JP)


Satoshi Mukai of Tokyo (JP)


TARGET ANALYZER, TARGET ANALYSIS METHOD, AND TARGET ANALYSIS SYSTEM - A simplified explanation of the abstract

  • This abstract for appeared for US patent application number 18022105 Titled 'TARGET ANALYZER, TARGET ANALYSIS METHOD, AND TARGET ANALYSIS SYSTEM'

Simplified Explanation

The abstract above describes a target analyzer that includes a processor. The processor is designed to perform certain functions, but the specific details of those functions are not provided in the abstract. The abstract does not provide any exaggerated claims or titles.


Original Abstract Submitted

An example aspect of the invention, a target analyzer including at least one processor configured to: