US Patent Application 18022015. OPTICAL INTERFERENCE TOMOGRAPHIC IMAGING DEVICE simplified abstract
Contents
OPTICAL INTERFERENCE TOMOGRAPHIC IMAGING DEVICE
Organization Name
Inventor(s)
Shigeru Nakamura of Tokyo (JP)
OPTICAL INTERFERENCE TOMOGRAPHIC IMAGING DEVICE - A simplified explanation of the abstract
This abstract first appeared for US patent application 18022015 titled 'OPTICAL INTERFERENCE TOMOGRAPHIC IMAGING DEVICE
Simplified Explanation
The patent application describes an optical interference tomographic imaging device.
- The device includes a laser light source that emits light of varying wavelengths.
- The emitted light is split into object light and reference light.
- The object light is directed towards an object and scanned over a specific range.
- A light spectral data generation means generates information about the intensity ratio of interfering light between the reference light and the scattered object light.
- A wavelength dispersion compensation processing means compensates for the wavelength dependency based on the difference in path between the object light and reference light.
- A cross-section structure information generation means generates information about the cross-section structure of the object.
Original Abstract Submitted
This optical interference tomographic imaging device comprising: a wavelength swept laser light source; a splitting means for splitting light emitted from the light source into object light and reference light; an irradiation means for directing the object light outputted to an object, and scanning a predetermined range; a light spectral data generation means for generating information regarding the wavelength dependency of the intensity ratio of interfering light of the reference light and the object light that has been directed to the object to be measured and has been scattered; a wavelength dispersion compensation processing means for performing compensation for the information regarding the wavelength dependency generated, the compensation carried out based on the wavelength dispersion difference of the path of the object light path and the path of the reference light; and a cross section structure information generation means for generating cross section structure information of the object.
