US Patent Application 18020624. LASER MACHINING APPARATUS simplified abstract

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LASER MACHINING APPARATUS

Organization Name

Mitsubishi Electric Corporation


Inventor(s)

Kyohei Ishikawa of Tokyo (JP)


Masaki Seguchi of Tokyo (JP)


Motoaki Nishiwaki of Tokyo (JP)


Kenta Fujii of Tokyo (JP)


Tomotaka Katsura of Tokyo (JP)


LASER MACHINING APPARATUS - A simplified explanation of the abstract

  • This abstract for appeared for US patent application number 18020624 Titled 'LASER MACHINING APPARATUS'

Simplified Explanation

The abstract describes a laser machining apparatus that includes an actuator to control the positioning of a machining head and a workpiece. A control unit manages the laser oscillator, machining head, and actuator based on a machining parameter. A machining state observation unit detects light intensities in different wavelength bands from the workpiece using optical sensor signals. A feature extraction unit extracts features from the correlation between the optical sensor signals and one of the signals. A correction quantity calculation unit determines the correction parameter and quantity for the machining parameter based on the extracted features.


Original Abstract Submitted

A laser machining apparatus includes an actuator that changes relative positions of a machining head and a workpiece; a control unit that controls in machining execution the laser oscillator, the machining head, and the actuator based on a machining parameter; a machining state observation unit that detects, from process light that is light generated from the workpiece by laser beam irradiation, light intensities in a plurality of predetermined wavelength bands as a plurality of optical sensor signals; a feature extraction unit that extracts at least one of features, the features being obtainable from an index of correlation between the plurality of optical sensor signals and from one of the optical sensor signals; and a correction quantity calculation unit that determines the machining parameter to be corrected as a correction parameter and a correction quantity for the correction parameter based on the at least one of the features.