US Patent Application 18017485. Foreign Substance Detection Device and Detection Method simplified abstract
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Contents
Foreign Substance Detection Device and Detection Method
Organization Name
Inventor(s)
Foreign Substance Detection Device and Detection Method - A simplified explanation of the abstract
This abstract first appeared for US patent application 18017485 titled 'Foreign Substance Detection Device and Detection Method
Simplified Explanation
The patent application describes a debris detection apparatus and method for identifying metal debris on the surface of an inspection target during battery manufacturing.
- The apparatus emits far-infrared electromagnetic waves towards the inspection target.
- The reflected waves from the surface of the inspection target are analyzed using a thermal image recorder.
- The purpose is to easily detect metal debris on the surface of the inspection target.
- The method utilizes the characteristics of the reflected waves to identify the presence of metal debris.
- This innovation aims to improve the efficiency and accuracy of debris detection during the battery manufacturing process.
Original Abstract Submitted
A debris detection apparatus and a debris detection method, capable of easily detecting a metal debris existing on the surface of an inspection target by emitting electromagnetic waves having a wavelength in a far-infrared band toward the inspection target during a battery manufacturing process and then analyzing the characteristics of reflected waves from the surface of the inspection target through a thermal image recorder.
