US Patent Application 17990571. METHOD FOR INSPECTING PRODUCT DEFECTS, ELECTRONIC DEVICE, AND STORAGE MEDIUM simplified abstract
Contents
METHOD FOR INSPECTING PRODUCT DEFECTS, ELECTRONIC DEVICE, AND STORAGE MEDIUM
Organization Name
HON HAI PRECISION INDUSTRY CO., LTD.
Inventor(s)
YIN-CHUNG Leung of New Taipei (TW)
METHOD FOR INSPECTING PRODUCT DEFECTS, ELECTRONIC DEVICE, AND STORAGE MEDIUM - A simplified explanation of the abstract
This abstract first appeared for US patent application 17990571 titled 'METHOD FOR INSPECTING PRODUCT DEFECTS, ELECTRONIC DEVICE, AND STORAGE MEDIUM
Simplified Explanation
- The patent application describes a method for inspecting product defects using an electronic device. - The method involves determining the category of a product and obtaining golden sample images of the product. - An inspection tool is selected based on the product category using a preset application. - Labeling information is created for the golden sample images based on the selected inspection tools. - Images of the product to be inspected are obtained and inspected using the labeling information from the golden sample images.
Original Abstract Submitted
A method for inspecting product defects implemented in an electronic device includes determining a category of a product, and obtaining golden sample images of the product; selecting at least one inspection tool by a preset application according to the category of the product; creating labeling information of the golden sample image of the product according to the selected inspection tools; and obtaining at least one image of a product to be inspected, and inspecting the at least one image of the product to be inspected according to the labeling information of the golden sample images of the product.
