US Patent Application 17928349. CHARACTERIZATION OF TIME-CORRELATED QUANTUM ERRORS THROUGH ENTANGLEMENT simplified abstract
Contents
CHARACTERIZATION OF TIME-CORRELATED QUANTUM ERRORS THROUGH ENTANGLEMENT
Organization Name
Inventor(s)
Yuezhen Niu of Mountain View CA (US)
Trevor Johnathan Mccourt of Mountain View CA (US)
Masoud Mohseni of Mountain View CA (US)
Vadim Smelyanskiy of Mountain View CA (US)
CHARACTERIZATION OF TIME-CORRELATED QUANTUM ERRORS THROUGH ENTANGLEMENT - A simplified explanation of the abstract
This abstract first appeared for US patent application 17928349 titled 'CHARACTERIZATION OF TIME-CORRELATED QUANTUM ERRORS THROUGH ENTANGLEMENT
Simplified Explanation
- The patent application is about efficiently measuring and characterizing errors in a quantum computer. - The method involves placing the quantum computer in a highly-entangled state called a Greenberger-Horne-Zeilinger (GHZ) state. - Quantum errors are accumulated in this highly entangled state. - The accumulated errors are then measured to characterize them. - One approach involves measuring the parity oscillations of the GHZ state. - A quantum error model is fitted to a power spectrum of the parity oscillations. - The fitted quantum error model can be used to select a suitable fault-tolerant error correction scheme for the quantum computer based on its environmental noise.
Original Abstract Submitted
Errors that affect a quantum computer can be efficiently measured and characterized by placing the quantum computer in a highly-entangled state such as a Greenberger-Horne-Zeilinger (GHZ) state, accumulating quantum errors in the highly entangled state, and then measuring the accumulated errors. In some approaches, the error characterization includes measuring parity oscillations of the GHZ state and fitting a quantum error model to a power spectrum of the parity oscillations. The fitted quantum error model can be used to select a suitable fault-tolerant error correction scheme for the quantum computer given its environmental noise.
