US Patent Application 17899056. METHOD AND APPARATUS FOR TESTING COMMAND, TEST PLATFORM, AND READABLE STORAGE MEDIUM simplified abstract

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METHOD AND APPARATUS FOR TESTING COMMAND, TEST PLATFORM, AND READABLE STORAGE MEDIUM

Organization Name

CHANGXIN MEMORY TECHNOLOGIES, INC.

Inventor(s)

Yu Li of Hefei (CN)

Teng Shi of Hefei (CN)

METHOD AND APPARATUS FOR TESTING COMMAND, TEST PLATFORM, AND READABLE STORAGE MEDIUM - A simplified explanation of the abstract

This abstract first appeared for US patent application 17899056 titled 'METHOD AND APPARATUS FOR TESTING COMMAND, TEST PLATFORM, AND READABLE STORAGE MEDIUM

Simplified Explanation

The patent application describes a method and apparatus for testing a command.

  • The method involves determining the duration of a deselect command based on the time interval between a target command and historical commands.
  • The target command is then sent to a memory after the deselect command.
  • The purpose of this invention is to improve the testing process for commands sent to a memory.


Original Abstract Submitted

A method and apparatus for testing a command are provided. The method includes that: when the test platform exists a target command to be sent to a memory, a duration of a deselect command is determined according to a minimum time interval between a target command and each of historical commands and the time when the each of the historical commands is sent and the present time; the target command is sent to the memory after the deselect command.

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