US Patent Application 17884164. APPARATUS AND METHOD FOR MEASURING HUMIDITY FOR DRYER simplified abstract

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APPARATUS AND METHOD FOR MEASURING HUMIDITY FOR DRYER

Organization Name

LG ELECTRONICS INC.


Inventor(s)

Byeonggeun Kang of Seoul (KR)


Mangeun Kim of Seoul (KR)


Hyunjin Park of Seoul (KR)


APPARATUS AND METHOD FOR MEASURING HUMIDITY FOR DRYER - A simplified explanation of the abstract

  • This abstract for appeared for US patent application number 17884164 Titled 'APPARATUS AND METHOD FOR MEASURING HUMIDITY FOR DRYER'

Simplified Explanation

This abstract describes an apparatus and method for measuring the humidity of an object being dried in a dryer. The apparatus includes a capacitance measuring sensor that detects changes in capacitance caused by the humidity of the object. It also includes a shield to reduce noise generated by the dryer. The apparatus is connected to a processor, which applies a signal to the sensor and shield to measure the capacitance change and determine the humidity level of the object.


Original Abstract Submitted

Provided are an apparatus and method for measuring humidity of an object to be dried in a dryer. The apparatus for measuring the humidity for the dryer includes a capacitance measuring sensor configured to measure an amount of capacitance change that is changed due to humidity of an object to be dried, which is put into the dryer; a shield configured to shield noise generated in the dryer; and a processor electrically connected to the capacitance measuring sensor and the shield, wherein the processor is configured to apply a second signal having the same waveform and the same voltage to the capacitance measuring sensor and the shield and acquire the amount of capacitance change, based on the first signal output from the capacitance measuring sensor so as to measure an amount of humidity change of the object to be dried.