US Patent Application 17857098. IMAGE FEATURE MATCHING METHOD, COMPUTER DEVICE, AND STORAGE MEDIUM simplified abstract
Contents
IMAGE FEATURE MATCHING METHOD, COMPUTER DEVICE, AND STORAGE MEDIUM
Organization Name
HON HAI PRECISION INDUSTRY CO., LTD.
Inventor(s)
WAN-JHEN Lee of New Taipei (TW)
CHIN-PIN Kuo of New Taipei (TW)
IMAGE FEATURE MATCHING METHOD, COMPUTER DEVICE, AND STORAGE MEDIUM - A simplified explanation of the abstract
This abstract first appeared for US patent application 17857098 titled 'IMAGE FEATURE MATCHING METHOD, COMPUTER DEVICE, AND STORAGE MEDIUM
Simplified Explanation
- The present disclosure describes a method for matching image features using an edge detection algorithm. - The method involves identifying weak texture areas in two images and extracting feature points from these areas. - The feature points from the first image are matched with corresponding feature points from the second image by determining a target point for each first feature point. - The position difference between each first feature point and its corresponding target point is calculated to determine a matching point for each first feature point. - This method can be used to accurately match image features, which can be useful in various applications such as image recognition and object tracking.
Original Abstract Submitted
An image feature matching method is provided by the present disclosure. The method includes determining a first weak texture area of a first image and a second weak texture area of a second image based on an edge detection algorithm. First feature points of the first weak texture area and second feature points of the second weak texture area are extracted. The first feature points and the second feature points are matched by determining a target point for each of the first feature points from the second feature points. Once a position difference value between each first feature point and the corresponding target point is determined, a matching point for each first feature point is determined according to the position difference value between the each first feature point and the corresponding target point.
