US Patent Application 17844083. CAPTURE IR DROP ANALYZER AND ANALYZING METHOD THEREOF simplified abstract
Contents
CAPTURE IR DROP ANALYZER AND ANALYZING METHOD THEREOF
Organization Name
Taiwan Semiconductor Manufacturing Company, Ltd.
Inventor(s)
CAPTURE IR DROP ANALYZER AND ANALYZING METHOD THEREOF - A simplified explanation of the abstract
- This abstract for appeared for US patent application number 17844083 Titled 'CAPTURE IR DROP ANALYZER AND ANALYZING METHOD THEREOF'
Simplified Explanation
The abstract describes a capture IR drop analyzer and a method for analyzing it. The analyzer receives information about the circuit layout and package model of a circuit. It then analyzes different circuit blocks corresponding to bump current sources based on this information. It calculates critical circuit blocks based on the bump current sources and the current demand of each circuit block. Finally, it analyzes the clock tree architecture of the critical circuit blocks to obtain information for adjusting the design structure.
Original Abstract Submitted
A capture IR drop analyzer and an analyzing method thereof are provided. The capture IR drop analyzing method includes: receiving circuit layout information and package model information of a circuit; analyzing a plurality of circuit blocks respectively corresponding to a plurality of bump current sources according to the circuit layout information and the package model information; calculating at least one critical circuit block according to each of the bump current sources and a current demand value of each of the corresponding circuit blocks; and analyzing a clock tree architecture of the at least one critical circuit block to obtain design structure adjustment information.
