US Patent Application 17828967. ANALOG-TO-DIGITAL CONVERTER (ADC) HAVING SELECTIVE COMPARATOR OFFSET ERROR TRACKING AND RELATED CORRECTIONS simplified abstract

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ANALOG-TO-DIGITAL CONVERTER (ADC) HAVING SELECTIVE COMPARATOR OFFSET ERROR TRACKING AND RELATED CORRECTIONS

Organization Name

TEXAS INSTRUMENTS INCORPORATED

Inventor(s)

Viswanathan Nagarajan of Bengaluru (IN)

Aniket Datta of Bengaluru (IN)

Nithin Gopinath of Bengaluru (IN)

ANALOG-TO-DIGITAL CONVERTER (ADC) HAVING SELECTIVE COMPARATOR OFFSET ERROR TRACKING AND RELATED CORRECTIONS - A simplified explanation of the abstract

This abstract first appeared for US patent application 17828967 titled 'ANALOG-TO-DIGITAL CONVERTER (ADC) HAVING SELECTIVE COMPARATOR OFFSET ERROR TRACKING AND RELATED CORRECTIONS

Simplified Explanation

The patent application describes an analog-to-digital converter (ADC) that includes various components and features for improved accuracy and calibration.

  • The ADC includes a set of comparators that compare an analog signal with reference thresholds to provide comparison results.
  • Digitization circuitry then converts these comparison results into a digital output code using a mapping.
  • The ADC also includes calibration circuitry to ensure accurate measurements.
  • The calibration circuitry receives the comparison results and determines if the analog signal is close to any of the reference thresholds.
  • If the analog signal is found to be close to a threshold, the calibration circuitry applies different pseudorandom binary sequence (PRBS) values to the analog signal and receives corresponding ADC values.
  • Based on these ADC values, the calibration circuitry determines an offset error, which represents any deviation from the expected values.
  • If the estimated offset error exceeds a predetermined threshold, the calibration circuitry provides a comparator input offset calibration signal at its output.
  • This calibration signal can be used to adjust the ADC and compensate for any offset errors, thereby improving the accuracy of the conversion process.


Original Abstract Submitted

An analog-to-digital converter (ADC) includes: a set of comparators configured to provide comparison results based on an analog signal and respective reference thresholds for comparators of the set of comparators; digitization circuitry configured to provide a digital output code based on the comparison results and a mapping; and calibration circuitry. The calibration circuitry is configured to: receive the comparison results; determine if the analog signal is proximate to one of the respective reference thresholds based on the comparison results; in response to determining the analog signal is proximate to one of the respective reference thresholds, receive ADC values based on different pseudorandom binary sequence (PRBS) values being applied to the analog signal; determine an offset error based on the ADC values; and provide a comparator input offset calibration signal at a calibration circuitry output if the estimated offset error is greater than an offset error threshold.

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