US Patent Application 17804090. CONDUCTIVE PROBE, METHOD OF MANUFACTURING THE SAME, AND PROBE CARD DEVICE HAVING THE SAME simplified abstract
Contents
CONDUCTIVE PROBE, METHOD OF MANUFACTURING THE SAME, AND PROBE CARD DEVICE HAVING THE SAME
Organization Name
Taiwan Semiconductor Manufacturing Company, Ltd.
Inventor(s)
Chih-Chieh Liao of HSINCHU CITY (TW)
Chih-Feng Cheng of HSINCHU CITY (TW)
Yu-Min Sun of HSINCHU CITY (TW)
CONDUCTIVE PROBE, METHOD OF MANUFACTURING THE SAME, AND PROBE CARD DEVICE HAVING THE SAME - A simplified explanation of the abstract
- This abstract for appeared for US patent application number 17804090 Titled 'CONDUCTIVE PROBE, METHOD OF MANUFACTURING THE SAME, AND PROBE CARD DEVICE HAVING THE SAME'
Simplified Explanation
The abstract describes a conductive probe that is used to test a device. The probe has a columnar body with a longitudinal direction. It has two contacting surfaces, one on each end, that are shaped like a cross or an X. These surfaces are used to make contact with a conductive pillar on the device being tested.
Original Abstract Submitted
A conductive probe includes a columnar body. The columnar body is defined with a longitudinal direction. The columnar body is provided with a first contacting surface and a second contacting surface in the longitudinal direction. The first contacting surface is opposite to the second contacting surface, and the first contacting surface is cross shaped or X-shaped for contacting to a conductive pillar of a device under test (DUT).
