US Patent Application 17799219. MAXIMUM SENSITIVITY DEGRADATION FOR DUAL CONNECTIVITY simplified abstract

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MAXIMUM SENSITIVITY DEGRADATION FOR DUAL CONNECTIVITY

Organization Name

LG ELECTRONICS INC.


Inventor(s)

Suhwan Lim of Seoul (KR)


MAXIMUM SENSITIVITY DEGRADATION FOR DUAL CONNECTIVITY - A simplified explanation of the abstract

  • This abstract for appeared for US patent application number 17799219 Titled 'MAXIMUM SENSITIVITY DEGRADATION FOR DUAL CONNECTIVITY'

Simplified Explanation

The abstract describes a user equipment (UE) in a wireless communication system. The UE includes a transceiver, a processor, and a computer memory. The memory stores instructions that, when executed by the processor, perform certain operations. These operations include transmitting an uplink signal using one operating band from a set of NR operating bands (n1, n7, n8, n28, n40, or n78) and one operating band from a set of E-UTRA operating bands (1, 3, or 7). The UE also receives a downlink signal using two operating bands from the set of NR operating bands and the one operating band from the set of E-UTRA operating bands.


Original Abstract Submitted

There is provided a UE in a wireless communication system, the UE comprising: at least one transceiver; at least one processor; and at least one computer memory operably connectable to the at least one processor and storing instructions that, based on being executed by the at least one processor, perform operations comprising: transmitting an uplink signal via one NR operating band among NR operating band n1, n7, n8, n28, n40, or n78 and one E-UTRA operating band among E-UTRA operating band 1, 3, or 7; and receiving a downlink signal based on two NR operating bands among the NR operating band n1, n7, n8, n28, n40, or n78 and the one E-UTRA operating band.