US Patent Application 17796382. CONTROL DEVICE AND CONTROL METHOD simplified abstract
Contents
CONTROL DEVICE AND CONTROL METHOD
Organization Name
Mitsubishi Electric Corporation
Inventor(s)
Toshinori Matsui of Tokyo (JP)
CONTROL DEVICE AND CONTROL METHOD - A simplified explanation of the abstract
- This abstract for appeared for US patent application number 17796382 Titled 'CONTROL DEVICE AND CONTROL METHOD'
Simplified Explanation
The abstract describes a system that includes a holder for functional elements, an abnormality detector, processing target identifying circuitry, and a functional element switcher. The system is designed to detect abnormalities caused by security attacks on a communication network. When an abnormality is detected, the processing target identifying circuitry identifies the affected functional element and related functional elements. The functional element switcher then switches the control functions of the affected functional elements to corresponding backup functional elements for execution. The processing target identifying circuitry determines the related functional element based on its operating status similarity to the affected functional element.
Original Abstract Submitted
Provided are a functional element holder to hold a plurality of functional elements for executing the control and also backup functional elements, an abnormality detector to detect an abnormality caused by a security attack via the communication network, a processing target identifying circuitry to identify, as processing targets, a functional element in which the abnormality is detected and a related functional element related to the abnormality among the plurality of functional elements, and a functional element switcher to switch control functions of the functional elements identified as the processing targets to corresponding respective backup functional elements to cause an execution. The processing target identifying circuitry is configured to extract, as the related functional element, a functional element that is determined to have an operating status having a similarity to that of the functional element in which the abnormality is detected.
