US Patent Application 17738600. ERROR CHECK FUNCTIONALITY VERIFICATION USING KNOWN ERRORS simplified abstract

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ERROR CHECK FUNCTIONALITY VERIFICATION USING KNOWN ERRORS

Organization Name

Micron Technology, Inc.


Inventor(s)

Francesco Lupo of Munich (DE)

ERROR CHECK FUNCTIONALITY VERIFICATION USING KNOWN ERRORS - A simplified explanation of the abstract

This abstract first appeared for US patent application 17738600 titled 'ERROR CHECK FUNCTIONALITY VERIFICATION USING KNOWN ERRORS

Simplified Explanation

The patent application describes methods, systems, and apparatuses for error check functionality in a memory device that stores encoded data.

  • The memory device receives a request from a host for error check functionality.
  • The encoded data is written to a verification portion of the memory device with intentional errors.
  • In response to the request, a read command is initiated on the verification portion.
  • Based on the result of the read command and the number of intentional errors in the encoded data, an error check functionality indicator is determined.
  • The error check functionality indicator corresponding to the number of intentional errors is sent back to the host.


Original Abstract Submitted

Methods, systems, and apparatuses include receiving, from a host, an error check functionality request for a memory device that stores encoded data. The encoded data is written to a verification portion of memory with at least one intentional error. A read command of the verification portion is initiated in response to the request. An error check functionality indicator is determined based on a result of the read command and a number of intentional errors in the encoded data. The error check functionality indicator corresponding to the number intentional errors in the encoded data is sent to the host.