US Patent Application 17737067. APPARATUSES AND METHODS FOR ANALYZING MULTIPLE OPTICAL SIGNALS IN PARALLEL simplified abstract

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APPARATUSES AND METHODS FOR ANALYZING MULTIPLE OPTICAL SIGNALS IN PARALLEL

Organization Name

Intel Corporation


Inventor(s)

Henry Wladkowski of Chandler AZ (US)

APPARATUSES AND METHODS FOR ANALYZING MULTIPLE OPTICAL SIGNALS IN PARALLEL - A simplified explanation of the abstract

This abstract first appeared for US patent application 17737067 titled 'APPARATUSES AND METHODS FOR ANALYZING MULTIPLE OPTICAL SIGNALS IN PARALLEL

Simplified Explanation

The patent application describes an apparatus that uses optical fiber ports to input and output light through optical fiber channels.

  • The apparatus includes a spinning mask that allows a portion of the incident light to pass through based on a pattern on the mask, while blocking the remaining portion of the light.
  • A photodetector is used to detect the allowed portion of the light as input signals.
  • A testing device is then used to transform the input signals into the frequency domain and obtain measured signals corresponding to the optical fiber channels.
  • The testing device compares the measured signals with a threshold signal to determine if there are any failures.


Original Abstract Submitted

An apparatus includes optical fiber ports into which optical fiber channels are input, the optical fiber channels carrying and outputting light, a mask configured to, while spinning at a frequency, allow a first portion of the light incident on the mask to pass through the mask, and block a remaining portion of the light incident on the mask, based on a pattern on the mask, and a photodetector configured to detect the allowed first portion of the light as input signals. The apparatus further includes a testing device configured to transform the input signals to a frequency domain, to obtain measured signals in frequencies respectively corresponding to the optical fiber channels, and determine whether each of the measured signals is a failure by comparing the obtained measured signals with a threshold signal.

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