US Patent Application 17734950. METHODS AND SYSTEMS FOR SHIFT ESTIMATION FOR ONE OR MORE OUTPUT FRAMES simplified abstract
Contents
METHODS AND SYSTEMS FOR SHIFT ESTIMATION FOR ONE OR MORE OUTPUT FRAMES
Organization Name
Inventor(s)
Narayana Karthik Ravirala of San Diego CA (US)
Shizhong Liu of San Diego CA (US)
Weiliang Liu of San Diego CA (US)
Ron Gaizman of Hof HaCarmel (IL)
Lianming Shi of Richmond CA (US)
METHODS AND SYSTEMS FOR SHIFT ESTIMATION FOR ONE OR MORE OUTPUT FRAMES - A simplified explanation of the abstract
- This abstract for appeared for US patent application number 17734950 Titled 'METHODS AND SYSTEMS FOR SHIFT ESTIMATION FOR ONE OR MORE OUTPUT FRAMES'
Simplified Explanation
This abstract describes a method for controlling exposure in image capture devices. The method involves receiving sensor data that indicates movement of the device while capturing two frames, where the first frame has a higher exposure setting than the second frame. Based on this data, the method predicts a shift needed to align the features of the two frames. The shift is then applied to align the features, and a frame output is generated by combining portions of the first and second frames.
Original Abstract Submitted
The present disclosure generally relates to exposure control for image capture devices. One example method generally includes receiving sensor data indicating a movement associated with an image capture device capturing a first frame and a second frame, wherein the first frame is associated with a higher exposure setting as compared to the second frame; predicting, based on the sensor data, a shift for aligning one or more features of the first frame and one or more features of the second frame; applying the shift to align the one or more features of the first frame and the one or more features of second frame; and generating a frame output at least in part by combining at least a portion of the first frame with at least a portion of the second frame.
