US Patent Application 17716069. TEMPERATURE-ACCELERATED SOLID-STATE STORAGE TESTING METHODS simplified abstract
Contents
TEMPERATURE-ACCELERATED SOLID-STATE STORAGE TESTING METHODS
Organization Name
Inventor(s)
Samuel Hudson of Foxborough MA (US)
Michael Rijo of Seekonk MA (US)
Robert Proulx of Holden MA (US)
TEMPERATURE-ACCELERATED SOLID-STATE STORAGE TESTING METHODS - A simplified explanation of the abstract
- This abstract for appeared for US patent application number 17716069 Titled 'TEMPERATURE-ACCELERATED SOLID-STATE STORAGE TESTING METHODS'
Simplified Explanation
This abstract describes a method for testing the performance and reliability of a solid-state storage system. The method involves writing data to the storage system and subjecting it to a higher temperature for a shorter period of time, which simulates the effects of operating at a lower temperature for a longer period of time. The data is then read from the storage system at a different temperature to generate test data. Based on the results of the first test, the storage system is subjected to the higher temperature for a reduced time period, equivalent to operating at a different temperature for a longer period of time. The data is then read again to generate a second set of test data. This method allows for accelerated testing of the storage system's performance and reliability under different temperature conditions.
Original Abstract Submitted
A temperature-accelerated solid-state storage testing method includes writing data to a storage system and subjecting the storage system to a first temperature range for a first time period that is equivalent to operation at a lower/second temperature for a greater/second time period. Subsequently, the data from the storage system is read within a third time period at a third temperature range to generate first test data. The storage system is then subjected to the first temperature range for a fourth time period that was reduced relative to the first time period based on the reading of the data to generate the first test data causing the operation of storage system to be equivalent to operating at the second temperature range for a fifth time period. Subsequently the data from the storage system is read within the third time period at the third temperature range to generate second test data.
