US Patent Application 17715591. TECHNIQUES FOR PANEL-SPECIFIC CLI MEASUREMENT simplified abstract
Contents
TECHNIQUES FOR PANEL-SPECIFIC CLI MEASUREMENT
Inventors
Tianyang Bai of Somerville NJ (US)
Qian Zhang of Basking Ridge NJ (US)
Junyi Li of Fairless Hills PA (US)
TECHNIQUES FOR PANEL-SPECIFIC CLI MEASUREMENT - A simplified explanation of the abstract
- This abstract for appeared for patent application number 17715591 Titled 'TECHNIQUES FOR PANEL-SPECIFIC CLI MEASUREMENT'
Simplified Explanation
This abstract describes methods, systems, and devices for wireless communications. It explains how a first user equipment (UE), referred to as the "victim" UE, can receive control signaling that identifies a specific set of antenna panels that can be used to measure cross-link interference (CLI) within a set of CLI resources. The first UE then performs CLI measurements on signals received from a second UE, known as the "aggressor" UE, using the identified antenna panels and CLI resources. Afterward, the first UE transmits a CLI report that includes information about the antenna panel used, the CLI resources associated with that panel, or both.
Original Abstract Submitted
Methods, systems, and devices for wireless communications are described. A first user equipment (UE) (e.g., “victim” UE) may receive control signaling identifying a set of antenna panels of the first UE usable for measuring cross-link interference (CLI) experienced within a set of CLI resources. The first UE may perform CLI measurements on signals received from a second UE (e.g., “aggressor” UE) via the set of CLI resources and the set of antenna panels. The first UE may then transmit a CLI report associated with CLI measurements performed on the signals received via an antenna panel of the set of antenna panels. In some implementations, the CLI report includes an indication of the antenna panel, an indication one or more CLI resources from the set of CLI resources associated with the antenna panel, or a combination thereof.
