US Patent Application 17664724. TESTERS, TESTING SYSTEMS AND METHODS OF TESTING ELECTRICAL COMPONENTS simplified abstract

TESTERS, TESTING SYSTEMS AND METHODS OF TESTING ELECTRICAL COMPONENTS

Organization Name

GM GLOBAL TECHNOLOGY OPERATIONS LLC

Inventor(s)

Michael H. Shaffer of Almont MI (US)

Gustavo Sanchez Taccone of Dubin (IE)

Aaron Cullen of Avoca (IE)

Ronan Conneely of Glanmire (IE)

Stonewall Jackson Craig, Iii of Macomb Twp. MI (US)

Jimmy D. Hart of Marlow OK (US)

Charles Wallace Thompson of Smiths Grove KY (US)

TESTERS, TESTING SYSTEMS AND METHODS OF TESTING ELECTRICAL COMPONENTS - A simplified explanation of the abstract

This abstract first appeared for US patent application 17664724 titled 'TESTERS, TESTING SYSTEMS AND METHODS OF TESTING ELECTRICAL COMPONENTS

Simplified Explanation

The abstract describes a tester for electrical components that has a database of testing specifications, a connector to physically and electrically connect to different components, and an output device.

• The tester identifies the connected component and retrieves its testing specifications from the database.
• It commands a test of the component based on the specifications.
• The tester then outputs an indication of the test result through the output device.

Original Abstract Submitted

A tester for testing an electrical component. The tester includes a database of testing specifications for electrical components, a tester connector for physically and electrically connecting to different electrical components, and an output device. The tester identifies an electrical component connected to the tester connector and provide corresponding identification data, retrieves a testing specification from the database using the identification data, commands a test of the electrical component according to the testing specification, and outputs an indication of a result of the test through the output device.