US Patent Application 17662601. PERFORMING MEASUREMENTS OF FREQUENCIES ASSOCIATED WITH TERRESTRIAL NETWORK CELLS simplified abstract

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PERFORMING MEASUREMENTS OF FREQUENCIES ASSOCIATED WITH TERRESTRIAL NETWORK CELLS

Organization Name

QUALCOMM Incorporated


Inventor(s)

Bharat Shrestha of San Diego CA (US)

Umesh Phuyal of San Diego CA (US)

Changhwan Park of San Diego CA (US)

Jae Ho Ryu of San Diego CA (US)

PERFORMING MEASUREMENTS OF FREQUENCIES ASSOCIATED WITH TERRESTRIAL NETWORK CELLS - A simplified explanation of the abstract

This abstract first appeared for US patent application 17662601 titled 'PERFORMING MEASUREMENTS OF FREQUENCIES ASSOCIATED WITH TERRESTRIAL NETWORK CELLS

Simplified Explanation

- The patent application is related to wireless communication. - It describes a method for a user equipment (UE) to receive information about frequencies associated with a terrestrial network (TN) cell from a network entity via a system information block (SIB). - The information received may include details such as priority of frequency, frequency-specific offset, or cell-specific offset. - The UE can then perform measurements of the frequencies associated with the TN cell during its idle mode. - The measurements are based on the location of the UE being within the TN cell. - The patent application mentions that there are numerous other aspects described, but they are not specified in the abstract.


Original Abstract Submitted

Various aspects of the present disclosure generally relate to wireless communication. In some aspects, a user equipment (UE) may receive, from a network entity and via a system information block (SIB), information that indicates frequencies associated with a terrestrial network (TN) cell. The information may include one or more of a priority of frequency, frequency-specific offset, or cell-specific offset. The UE may perform, during an idle mode of the UE, measurements of the frequencies associated with the TN cell based at least in part on a location of the UE being within the TN cell. Numerous other aspects are described.