US Patent Application 17662439. RESISTOR STRUCTURE IN INTEGRATED CIRCUIT simplified abstract

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RESISTOR STRUCTURE IN INTEGRATED CIRCUIT

Organization Name

INTERNATIONAL BUSINESS MACHINES CORPORATION


Inventor(s)

HUIMEI Zhou of Albany NY (US)

Baozhen Li of South Burlington VT (US)

Chih-Chao Yang of Glenmont NY (US)

Ashim Dutta of Clifton Park NY (US)

RESISTOR STRUCTURE IN INTEGRATED CIRCUIT - A simplified explanation of the abstract

This abstract first appeared for US patent application 17662439 titled 'RESISTOR STRUCTURE IN INTEGRATED CIRCUIT

Simplified Explanation

The patent application describes a resistor structure that consists of two layers: an electrically insulating layer and a resistive layer.

  • The first layer is made of a material with high thermal conductivity, equal to or greater than 100 W/m/K.
  • The second layer is made of resistive material and is directly adjacent to the first layer.
  • The first layer of electrically insulating material has a band gap equal to or greater than 4 eV.
  • The electrically insulating material can be selected from a group of materials including aluminum-nitride (AlN), boron-nitride (BN), and diamond (C).


Original Abstract Submitted

Embodiments of present invention provide a resistor structure. The resistor structure includes a first layer of electrically insulating material; and a second layer of resistive material directly adjacent to the first layer, wherein thermal conductivity of the first layer is equal to or larger than 100 W/m/K. In one embodiment, the first layer of electrically insulating material has a band gap equal to or larger than 4 eV and is selected from a group consisting of aluminum-nitride (AlN), boron-nitride (BN), and diamond (C).