US Patent Application 17598237. FAST MEASUREMENT WITH MULTIPLE CONCURRENT BEAMS simplified abstract
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Contents
FAST MEASUREMENT WITH MULTIPLE CONCURRENT BEAMS
Organization Name
Inventor(s)
Dawei Zhang of Saratoga CA (US)
Huaning Niu of San Jose CA (US)
Manasa Raghavan of Sunnyvale CA (US)
Xiang Chen of Campbell CA (US)
FAST MEASUREMENT WITH MULTIPLE CONCURRENT BEAMS - A simplified explanation of the abstract
- This abstract for appeared for US patent application number 17598237 Titled 'FAST MEASUREMENT WITH MULTIPLE CONCURRENT BEAMS'
Simplified Explanation
The abstract describes a method for a user equipment (UE) device. The method involves generating a message that includes information about the UE's capability to simultaneously measure at least two downlink (DL) beams. This message is then transmitted to a base station.
Original Abstract Submitted
Provided is a method for a user equipment (UE), comprising: generating a message that includes an indication of a capability of the UE indicating whether the UE supports simultaneous measurement for at least two downlink (DL) beams; and transmitting the message to a base station.
