US Patent Application 17441244. MEASUREMENT GAP CONFIGURATION FOR BANDWIDTH PART SWITCHING simplified abstract
Contents
MEASUREMENT GAP CONFIGURATION FOR BANDWIDTH PART SWITCHING
Organization Name
Inventor(s)
Dawei Zhang of Saratoga CA (US)
Yang Tang of Santa Clara CA (US)
Xiang Chen of Campbell CA (US)
Manasa Raghaven of Sunnyvale CA (US)
Huaning Niu of San Jose CA (US)
MEASUREMENT GAP CONFIGURATION FOR BANDWIDTH PART SWITCHING - A simplified explanation of the abstract
This abstract first appeared for US patent application 17441244 titled 'MEASUREMENT GAP CONFIGURATION FOR BANDWIDTH PART SWITCHING
Simplified Explanation
This patent application is about techniques for generating a report result based on measurements performed during a reporting period. The measurements are performed on a reference signal at different bandwidth parts (BWP) and measurement gaps. The configuration of the measurement gaps is determined based on the initial BWP configuration and the BWP configuration after switching.
- The patent application is about generating a report result based on measurements performed during a reporting period.
- The measurements are performed on a reference signal at different bandwidth parts (BWP) and measurement gaps.
- The configuration of the measurement gaps is determined based on the initial BWP configuration and the BWP configuration after switching.
Original Abstract Submitted
Some aspects of this disclosure relate to apparatuses and methods for implementing techniques for generating a report result based on a set of measurements performed at measurement gaps during a reporting period. The set of measurements are performed on a reference signal at a first bandwidth part (BWP) or a second BWP when BWP switching is performed. The first BWP has a first measurement gap configuration, the second BWP has a second measurement gap configuration. The measurement gaps of the reporting period are configured according to a third measurement gap configuration that is determined based on the first measurement gap configuration and the second measurement gap configuration.
