TEMPERATURE-ACCELERATED SOLID-STATE STORAGE TESTING METHODS: abstract simplified (17716069)

• This abstract for appeared for patent application number 17716069 Titled 'TEMPERATURE-ACCELERATED SOLID-STATE STORAGE TESTING METHODS'

Simplified Explanation

This abstract describes a method for testing the performance and reliability of solid-state storage systems. The method involves writing data to the storage system and subjecting it to a specific temperature range for a certain period of time. This temperature range is equivalent to operating the system at a lower temperature for a longer period of time. The data is then read from the storage system at a different temperature range within a specific time period, generating test data. Based on the results of this reading, the storage system is subjected to the initial temperature range for a shorter period of time, simulating operation at a higher temperature for a shorter period. The data is then read again at the same temperature range and time period, generating a second set of test data.

Original Abstract Submitted

A temperature-accelerated solid-state storage testing method includes writing data to a storage system and subjecting the storage system to a first temperature range for a first time period that is equivalent to operation at a lower/second temperature for a greater/second time period. Subsequently, the data from the storage system is read within a third time period at a third temperature range to generate first test data. The storage system is then subjected to the first temperature range for a fourth time period that was reduced relative to the first time period based on the reading of the data to generate the first test data causing the operation of storage system to be equivalent to operating at the second temperature range for a fifth time period. Subsequently the data from the storage system is read within the third time period at the third temperature range to generate second test data.