Samsung display co., ltd. (20240096286). SCAN DRIVER AND DISPLAY DEVICE INCLUDING THE SAME simplified abstract
Contents
- 1 SCAN DRIVER AND DISPLAY DEVICE INCLUDING THE SAME
- 1.1 Organization Name
- 1.2 Inventor(s)
- 1.3 SCAN DRIVER AND DISPLAY DEVICE INCLUDING THE SAME - A simplified explanation of the abstract
- 1.4 Simplified Explanation
- 1.5 Potential Applications
- 1.6 Problems Solved
- 1.7 Benefits
- 1.8 Potential Commercial Applications
- 1.9 Possible Prior Art
- 1.10 Original Abstract Submitted
SCAN DRIVER AND DISPLAY DEVICE INCLUDING THE SAME
Organization Name
Inventor(s)
KI NYENG Kang of YONGIN-SI (KR)
GUANGHAI Jin of YONGIN-SI (KR)
SUNKWANG Kim of YONGIN-SI (KR)
SCAN DRIVER AND DISPLAY DEVICE INCLUDING THE SAME - A simplified explanation of the abstract
This abstract first appeared for US patent application 20240096286 titled 'SCAN DRIVER AND DISPLAY DEVICE INCLUDING THE SAME
Simplified Explanation
The abstract describes a method of manufacturing a semiconductor device that involves designing a semiconductor device layout using a design rule manual (DRM), performing failure evaluation, updating the DRM based on the evaluation, redesigning the layout, and manufacturing the device.
- Designing semiconductor device layout using a design rule manual (DRM)
- Performing failure evaluation of semiconductor device, including gate structure failure
- Updating DRM based on failure evaluation
- Redesigning semiconductor device layout using updated DRM
- Manufacturing semiconductor device using redesigned layout
Potential Applications
The technology described in this patent application could be applied in the semiconductor industry for improving the design and manufacturing process of semiconductor devices.
Problems Solved
This technology helps in identifying and addressing failures in semiconductor devices, particularly gate structure failures, leading to enhanced product quality and reliability.
Benefits
The method outlined in the patent application allows for more efficient and effective manufacturing of semiconductor devices by incorporating failure evaluation feedback into the design process.
Potential Commercial Applications
The innovation could find commercial applications in semiconductor manufacturing companies looking to enhance their product quality and reliability through improved design processes.
Possible Prior Art
One possible prior art in this field could be the use of design rule manuals and failure evaluation techniques in semiconductor device manufacturing processes.
What is the impact of this technology on the semiconductor industry?
This technology could potentially revolutionize the semiconductor industry by streamlining the design and manufacturing process, leading to higher quality and more reliable semiconductor devices.
How does this method compare to existing techniques for failure evaluation in semiconductor devices?
This method stands out by integrating failure evaluation feedback directly into the design rule manual, allowing for a more iterative and efficient approach to addressing failures in semiconductor devices.
Original Abstract Submitted
a method of manufacturing a semiconductor device includes designing a semiconductor device layout using a design rule manual (drm), in which design rules are recorded, and performing failure evaluation of a failure including at least one gate structure failure of a semiconductor device manufactured using the designed semiconductor device layout. the method further includes updating the drm by updating the design rules recorded in the drm, based on a result of the failure evaluation, redesigning the semiconductor device layout using the updated drm, and manufacturing the semiconductor device using the redesigned semiconductor device layout.
