Difference between revisions of "Photogrammetry patent applications on April 20th, 2023"
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| − | =Patent Applications for Photogrammetry on | + | =Patent Applications for Photogrammetry on April 20th, 2023= |
Number of patent applications containing 'Photogrammetry' or its variations: 1 | Number of patent applications containing 'Photogrammetry' or its variations: 1 | ||
[[20230118227. FAST MEASUREMENT METHOD FOR MICRO-NANO DEEP GROOVE STRUCTURE BASED ON WHITE LIGHT INTERFERENCE simplified abstract (ZHEJIANG UNIVERSITY)]] | [[20230118227. FAST MEASUREMENT METHOD FOR MICRO-NANO DEEP GROOVE STRUCTURE BASED ON WHITE LIGHT INTERFERENCE simplified abstract (ZHEJIANG UNIVERSITY)]] | ||
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| + | Organization: ZHEJIANG UNIVERSITY | ||
Inventor(s): Kexin Zhang of Zhejiang (CN) for ZHEJIANG UNIVERSITY, Yiyong Liang of Zhejiang (CN) for ZHEJIANG UNIVERSITY, Guozhong Li of Zhejiang (CN) for ZHEJIANG UNIVERSITY | Inventor(s): Kexin Zhang of Zhejiang (CN) for ZHEJIANG UNIVERSITY, Yiyong Liang of Zhejiang (CN) for ZHEJIANG UNIVERSITY, Guozhong Li of Zhejiang (CN) for ZHEJIANG UNIVERSITY | ||
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| − | [[Category:G01B11/24]][[Category:G01N21/01]] | + | [[Category:G01B11/24]][[Category:G01N21/01]][[Category:ZHEJIANG UNIVERSITY]] |
[[Category:Photogrammetry]][[Category:ZHEJIANG UNIVERSITY]] | [[Category:Photogrammetry]][[Category:ZHEJIANG UNIVERSITY]] | ||
Latest revision as of 18:26, 2 January 2024
Patent Applications for Photogrammetry on April 20th, 2023
Number of patent applications containing 'Photogrammetry' or its variations: 1
Organization: ZHEJIANG UNIVERSITY
Inventor(s): Kexin Zhang of Zhejiang (CN) for ZHEJIANG UNIVERSITY, Yiyong Liang of Zhejiang (CN) for ZHEJIANG UNIVERSITY, Guozhong Li of Zhejiang (CN) for ZHEJIANG UNIVERSITY
IPC Code(s): G01B11/24, G01N21/01
