Optical Measurement System with Multiple Launch Sites: abstract simplified (18121427)

• This abstract for appeared for patent application number 18121427 Titled 'Optical Measurement System with Multiple Launch Sites'

Simplified Explanation

The abstract describes optical measurement systems that are used to analyze samples. These systems can emit light from different groups and have a switch network to control the routing of light. They can also measure light using different detector groups. The systems can perform measurements using various wavelengths, with different groups of wavelengths being measured using different numbers of launch and detector groups.

Original Abstract Submitted

Various embodiments disclosed herein describe optical measurement systems for characterizing a sample. The optical measurement systems may selectively emit light from different numbers of launch groups, and may include a multi-stage optical switch network that may be controlled to route light to a desired number of launch groups. The optical measurement systems may further measure light using a corresponding number of detector groups. The optical measurement systems may perform measurements using a plurality of different wavelengths, where different groups of these wavelengths may be measured using different numbers of launch groups (as well as corresponding detector groups).