Micron technology, inc. (20240127900). PERFORMING SELECTIVE COPYBACK IN MEMORY DEVICES simplified abstract

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PERFORMING SELECTIVE COPYBACK IN MEMORY DEVICES

Organization Name

micron technology, inc.

Inventor(s)

Vamsi Rayaprolu of San Jose CA (US)

Ashutosh Malshe of Fremont CA (US)

Gary Besinga of Boise ID (US)

Roy Leonard of San Jose CA (US)

PERFORMING SELECTIVE COPYBACK IN MEMORY DEVICES - A simplified explanation of the abstract

This abstract first appeared for US patent application 20240127900 titled 'PERFORMING SELECTIVE COPYBACK IN MEMORY DEVICES

Simplified Explanation

The abstract of the patent application describes a system and method involving a memory device and a processing device that work together to ensure data integrity in memory cells.

  • The processing device determines a data validity metric value for a set of memory cells.
  • If the data validity metric value meets a certain threshold, a data integrity check is performed on the memory cells to obtain a data integrity metric value.
  • If the data integrity metric value meets another threshold, an error handling operation is carried out on the data stored in the memory cells to correct any errors.

Potential Applications

This technology could be applied in various industries where data integrity is crucial, such as healthcare, finance, and telecommunications.

Problems Solved

This technology addresses the issue of data corruption in memory devices, ensuring that stored data remains accurate and reliable.

Benefits

The system and method described in the patent application help prevent data loss and maintain the integrity of stored information, leading to improved overall system performance and reliability.

Potential Commercial Applications

One potential commercial application of this technology could be in the development of secure data storage solutions for businesses and organizations.

Possible Prior Art

One possible prior art for this technology could be existing data integrity checking methods used in computer systems and storage devices.

Unanswered Questions

How does this technology compare to existing data integrity checking methods in terms of speed and accuracy?

This article does not provide a direct comparison between this technology and existing methods in terms of speed and accuracy. Further research and testing would be needed to determine the performance differences.

What are the potential limitations or drawbacks of implementing this technology in practical applications?

The article does not address any potential limitations or drawbacks of implementing this technology in practical applications. Additional studies and real-world testing may be necessary to identify any challenges that could arise.


Original Abstract Submitted

systems and methods are disclosed including a memory device and a processing device operatively coupled to the memory device. the processing device can perform operations comprising determining a data validity metric value with respect to a set of memory cells of the memory device; responsive to determining that the data validity metric value satisfies a first threshold criterion, performing a data integrity check on the set of memory cells to obtain a data integrity metric value; and responsive to determining that the data integrity metric value satisfies a second threshold criterion, performing an error handling operation on the data stored on the set of memory cells to generate corrected data.