Microfabrica Inc. patent applications published on March 21st, 2024

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Patent applications for Microfabrica Inc. on March 21st, 2024

Methods of Reinforcing Plated Metal Structures and Independently Modulating Mechanical Properties Using Nano-Fibers (17464612)

Main Inventor

Onnik Yaglioglu


Compliant Pin Probes with Extension Springs, Methods for Making, and Methods for Using (17854756)

Main Inventor

Ming Ting Wu


Compliant Probes Including Dual Independently Operable Probe Contact Elements Including At Least One Flat Extension Spring, Methods for Making, and Methods for Using (17898446)

Main Inventor

Ming Ting Wu


Shielded Probes for Semiconductor Testing, Methods for Using, and Methods for Making (17493802)

Main Inventor

Jia Li


Probes Having Improved Mechanical and/or Electrical Properties for Making Contact Between Electronic Circuit Elements and Methods for Making (17572892)

Main Inventor

Garret R. Smalley


Probes with Planar Unbiased Spring Elements for Electronic Component Contact and Methods for Making Such Probes (17507598)

Main Inventor

Arun S. Veeramani


Probes with Planar Unbiased Spring Elements for Electronic Component Contact, Methods for Making Such Probes, and Methods for Using Such Probes (17968552)

Main Inventor

Arun S. Veeramani


Probes with Planar Unbiased Spring Elements for Electronic Component Contact, Methods for Making Such Probes, and Methods for Using Such Probes (17968601)

Main Inventor

Arun S. Veeramani


Probes with Planar Unbiased Spring Elements for Electronic Component Contact, Methods for Making Such Probes, and Methods for Using Such Probes (17968638)

Main Inventor

Arun S. Veeramani


Multi-Beam Probes with Decoupled Structural and Current Carrying Beams and Methods of Making (17888384)

Main Inventor

Arun S. Veeramani


Methods for Making Probe Arrays Utilizing Lateral Plastic Deformation of Probe Preforms (17384680)

Main Inventor

Onnik Yaglioglu


Probe Arrays and Improved Methods for Making and Using Longitudinal Deformation of Probe Preforms (17401252)

Main Inventor

Michael S. Lockard


Methods for Making Probe Arrays Utilizing Deformed Templates (17390835)

Main Inventor

Onnik Yaglioglu


Probes Having Improved Mechanical and/or Electrical Properties for Making Contact Between Electronic Circuit Elements and Methods for Making (17680211)

Main Inventor

Uri Frodis