Microfabrica Inc. patent applications published on March 21st, 2024
Summary of the patent applications from Microfabrica Inc. on March 21st, 2024
Microfabrica Inc. has recently filed patents for innovative technologies related to probe array formation for testing electronic devices, semiconductor wafer and chip test applications, and DNA microarray analysis. These patents describe the creation of probe structures with multi-layer designs, deformable spring elements, and lateral displacement of structures for improved testing accuracy and efficiency. The technology allows for the simultaneous formation of multiple probes in array configurations, enhancing efficiency in probe array formation and increasing accuracy in biological assays.
- Summary:**
- Patents filed by Microfabrica Inc. focus on probe array formation for testing electronic devices and DNA analysis. - Technologies include multi-layer probe structures, deformable spring elements, and lateral displacement of structures. - Innovations aim to improve testing accuracy, efficiency, and consistency in probe configurations.
- Notable Applications:**
- Semiconductor testing
- DNA sequencing
- Medical diagnostics.
Contents
- 1 Patent applications for Microfabrica Inc. on March 21st, 2024
- 1.1 Methods of Reinforcing Plated Metal Structures and Independently Modulating Mechanical Properties Using Nano-Fibers (17464612)
- 1.2 Compliant Pin Probes with Extension Springs, Methods for Making, and Methods for Using (17854756)
- 1.3 Compliant Probes Including Dual Independently Operable Probe Contact Elements Including At Least One Flat Extension Spring, Methods for Making, and Methods for Using (17898446)
- 1.4 Shielded Probes for Semiconductor Testing, Methods for Using, and Methods for Making (17493802)
- 1.5 Probes Having Improved Mechanical and/or Electrical Properties for Making Contact Between Electronic Circuit Elements and Methods for Making (17572892)
- 1.6 Probes with Planar Unbiased Spring Elements for Electronic Component Contact and Methods for Making Such Probes (17507598)
- 1.7 Probes with Planar Unbiased Spring Elements for Electronic Component Contact, Methods for Making Such Probes, and Methods for Using Such Probes (17968552)
- 1.8 Probes with Planar Unbiased Spring Elements for Electronic Component Contact, Methods for Making Such Probes, and Methods for Using Such Probes (17968601)
- 1.9 Probes with Planar Unbiased Spring Elements for Electronic Component Contact, Methods for Making Such Probes, and Methods for Using Such Probes (17968638)
- 1.10 Multi-Beam Probes with Decoupled Structural and Current Carrying Beams and Methods of Making (17888384)
- 1.11 Methods for Making Probe Arrays Utilizing Lateral Plastic Deformation of Probe Preforms (17384680)
- 1.12 Probe Arrays and Improved Methods for Making and Using Longitudinal Deformation of Probe Preforms (17401252)
- 1.13 Methods for Making Probe Arrays Utilizing Deformed Templates (17390835)
- 1.14 Probes Having Improved Mechanical and/or Electrical Properties for Making Contact Between Electronic Circuit Elements and Methods for Making (17680211)
Patent applications for Microfabrica Inc. on March 21st, 2024
Methods of Reinforcing Plated Metal Structures and Independently Modulating Mechanical Properties Using Nano-Fibers (17464612)
Main Inventor
Onnik Yaglioglu
Compliant Pin Probes with Extension Springs, Methods for Making, and Methods for Using (17854756)
Main Inventor
Ming Ting Wu
Compliant Probes Including Dual Independently Operable Probe Contact Elements Including At Least One Flat Extension Spring, Methods for Making, and Methods for Using (17898446)
Main Inventor
Ming Ting Wu
Shielded Probes for Semiconductor Testing, Methods for Using, and Methods for Making (17493802)
Main Inventor
Jia Li
Probes Having Improved Mechanical and/or Electrical Properties for Making Contact Between Electronic Circuit Elements and Methods for Making (17572892)
Main Inventor
Garret R. Smalley
Probes with Planar Unbiased Spring Elements for Electronic Component Contact and Methods for Making Such Probes (17507598)
Main Inventor
Arun S. Veeramani
Probes with Planar Unbiased Spring Elements for Electronic Component Contact, Methods for Making Such Probes, and Methods for Using Such Probes (17968552)
Main Inventor
Arun S. Veeramani
Probes with Planar Unbiased Spring Elements for Electronic Component Contact, Methods for Making Such Probes, and Methods for Using Such Probes (17968601)
Main Inventor
Arun S. Veeramani
Probes with Planar Unbiased Spring Elements for Electronic Component Contact, Methods for Making Such Probes, and Methods for Using Such Probes (17968638)
Main Inventor
Arun S. Veeramani
Multi-Beam Probes with Decoupled Structural and Current Carrying Beams and Methods of Making (17888384)
Main Inventor
Arun S. Veeramani
Methods for Making Probe Arrays Utilizing Lateral Plastic Deformation of Probe Preforms (17384680)
Main Inventor
Onnik Yaglioglu
Probe Arrays and Improved Methods for Making and Using Longitudinal Deformation of Probe Preforms (17401252)
Main Inventor
Michael S. Lockard
Methods for Making Probe Arrays Utilizing Deformed Templates (17390835)
Main Inventor
Onnik Yaglioglu
Probes Having Improved Mechanical and/or Electrical Properties for Making Contact Between Electronic Circuit Elements and Methods for Making (17680211)
Main Inventor
Uri Frodis
