Kabushiki kaisha toshiba (20240094115). NON-TRANSITORY STORAGE MEDIUM, OPTICAL INSPECTION SYSTEM, PROCESSING APPARATUS FOR OPTICAL INSPECTION SYSTEM, AND OPTICAL INSPECTION METHOD simplified abstract
Contents
- 1 NON-TRANSITORY STORAGE MEDIUM, OPTICAL INSPECTION SYSTEM, PROCESSING APPARATUS FOR OPTICAL INSPECTION SYSTEM, AND OPTICAL INSPECTION METHOD
- 1.1 Organization Name
- 1.2 Inventor(s)
- 1.3 NON-TRANSITORY STORAGE MEDIUM, OPTICAL INSPECTION SYSTEM, PROCESSING APPARATUS FOR OPTICAL INSPECTION SYSTEM, AND OPTICAL INSPECTION METHOD - A simplified explanation of the abstract
- 1.4 Simplified Explanation
- 1.5 Potential Applications
- 1.6 Problems Solved
- 1.7 Benefits
- 1.8 Potential Commercial Applications
- 1.9 Possible Prior Art
- 1.10 Original Abstract Submitted
NON-TRANSITORY STORAGE MEDIUM, OPTICAL INSPECTION SYSTEM, PROCESSING APPARATUS FOR OPTICAL INSPECTION SYSTEM, AND OPTICAL INSPECTION METHOD
Organization Name
Inventor(s)
Hiroya Kano of Kawasaki Kanagawa (JP)
Hideaki Okano of Yokohama Kanagawa (JP)
NON-TRANSITORY STORAGE MEDIUM, OPTICAL INSPECTION SYSTEM, PROCESSING APPARATUS FOR OPTICAL INSPECTION SYSTEM, AND OPTICAL INSPECTION METHOD - A simplified explanation of the abstract
This abstract first appeared for US patent application 20240094115 titled 'NON-TRANSITORY STORAGE MEDIUM, OPTICAL INSPECTION SYSTEM, PROCESSING APPARATUS FOR OPTICAL INSPECTION SYSTEM, AND OPTICAL INSPECTION METHOD
Simplified Explanation
The patent application describes a non-transitory storage medium that stores an optical inspection program. The program removes a portion of the image captured by a camera, specifically the image of a wavelength selection portion included in the captured image.
- The innovation involves generating a wavelength selection portion-removed image by removing the image of the wavelength selection portion from the captured image.
- The captured image is of an object surface imaged through a wavelength selection portion that selects at least two different wavelength spectra from incident light.
Potential Applications
This technology could be applied in various industries such as:
- Quality control in manufacturing processes
- Medical imaging for diagnostics
- Environmental monitoring for pollution detection
Problems Solved
This technology helps in:
- Enhancing image clarity by removing unwanted portions
- Improving accuracy in analyzing captured images
- Streamlining inspection processes by focusing on specific wavelength spectra
Benefits
The benefits of this technology include:
- Increased efficiency in image analysis
- Enhanced image quality for better decision-making
- Reduction in errors and false interpretations in inspection processes
Potential Commercial Applications
Potential commercial applications of this technology could include:
- Integration into inspection equipment for industrial use
- Development of specialized cameras for medical imaging
- Incorporation into environmental monitoring devices for real-time analysis
Possible Prior Art
One possible prior art could be the use of image processing algorithms to remove specific portions of captured images for analysis purposes.
Unanswered Questions
How does this technology compare to existing image processing techniques in terms of efficiency and accuracy?
This article does not provide a direct comparison between this technology and existing image processing techniques. Further research or testing may be needed to determine the advantages of this innovation over current methods.
What are the potential limitations or challenges in implementing this technology in different industries or applications?
The article does not address any potential limitations or challenges that may arise in implementing this technology. Understanding these factors could be crucial for successful adoption and integration into various fields.
Original Abstract Submitted
according to an embodiment, a non-transitory storage medium stores an optical inspection program. the optical inspection program causes a processor to execute generating a wavelength selection portion-removed image by removing, from a captured image of an object surface imaged through a wavelength selection portion configured to select at least two different wavelength spectra from incident light, an image of the wavelength selection portion included in the captured image.
