Kabushiki kaisha toshiba (20240094091). MANUFACTURING DATA ANALYSIS DEVICE, SYSTEM, AND METHOD simplified abstract
Contents
MANUFACTURING DATA ANALYSIS DEVICE, SYSTEM, AND METHOD
Organization Name
Inventor(s)
Keisuke Kawauchi of Kawasaki Kanagawa (JP)
Takayuki Itoh of Kawasaki Kanagawa (JP)
Jumpei Ando of Yokohama Kanagawa (JP)
Toshiyuki Ono of Kawasaki Kanagawa (JP)
MANUFACTURING DATA ANALYSIS DEVICE, SYSTEM, AND METHOD - A simplified explanation of the abstract
This abstract first appeared for US patent application 20240094091 titled 'MANUFACTURING DATA ANALYSIS DEVICE, SYSTEM, AND METHOD
Simplified Explanation
The manufacturing data analysis device described in the abstract is designed to analyze manufacturing data to determine the influence of various manufacturing conditions on the quality of the products being produced. Here is a simplified explanation of the patent application:
- The device includes processing circuitry that acquires manufacturing data, which consists of manufacturing condition data and quality data.
- The processing circuitry calculates the influence exerted by specific manufacturing conditions on the quality data by analyzing the manufacturing data.
- If the calculated influence meets a certain condition, the processing circuitry generates output data related to the manufacturing conditions, quality data affected by those conditions, or the degree of influence itself.
Potential Applications of this Technology: - Quality control in manufacturing processes - Optimization of manufacturing conditions to improve product quality
Problems Solved by this Technology: - Identifying the impact of specific manufacturing conditions on product quality - Providing insights for improving manufacturing processes
Benefits of this Technology: - Enhanced quality control measures - Increased efficiency in manufacturing processes
Potential Commercial Applications of this Technology (SEO optimized title): - "Manufacturing Data Analysis Device: Commercial Applications"
Possible Prior Art: - Similar systems may exist in the field of quality control and manufacturing process optimization, but specific prior art is not provided in the abstract.
Unanswered Questions:
- How does the device determine the determination condition for the degrees of influence?
The abstract does not specify the exact criteria or algorithm used to determine when the degrees of influence satisfy a determination condition.
- What types of manufacturing data are included in the manufacturing condition data group?
The abstract mentions a manufacturing condition data group, but it does not detail the specific types of data that are included in this group.
Original Abstract Submitted
according to one embodiment, a manufacturing data analysis device includes processing circuitry. the processing circuitry acquires manufacturing data including a manufacturing condition data group and a quality data group. the processing circuitry calculates one or more degrees of influence exerted by first manufacturing condition data included in the manufacturing condition data group on respective pieces of quality data included in the quality data group by analyzing the manufacturing data. the processing circuitry, in a case where one or more degrees of influence satisfy a determination condition, generates output data related to at least one of the first manufacturing condition data, one or more pieces of quality data on which the first manufacturing condition data has exerted the degrees of influence satisfying the determination condition, or the degrees of influence satisfying the determination condition.
