International business machines corporation (20240113162). MONOLITHIC STACKED FIELD EFFECT TRANSISTOR (SFET) WITH DUAL MIDDLE DIELECTRIC ISOLATION (MDI) SEPARATION simplified abstract
Contents
- 1 MONOLITHIC STACKED FIELD EFFECT TRANSISTOR (SFET) WITH DUAL MIDDLE DIELECTRIC ISOLATION (MDI) SEPARATION
- 1.1 Organization Name
- 1.2 Inventor(s)
- 1.3 MONOLITHIC STACKED FIELD EFFECT TRANSISTOR (SFET) WITH DUAL MIDDLE DIELECTRIC ISOLATION (MDI) SEPARATION - A simplified explanation of the abstract
- 1.4 Simplified Explanation
- 1.5 Potential Applications
- 1.6 Problems Solved
- 1.7 Benefits
- 1.8 Potential Commercial Applications
- 1.9 Possible Prior Art
- 1.10 Unanswered Questions
- 1.11 Original Abstract Submitted
MONOLITHIC STACKED FIELD EFFECT TRANSISTOR (SFET) WITH DUAL MIDDLE DIELECTRIC ISOLATION (MDI) SEPARATION
Organization Name
international business machines corporation
Inventor(s)
Jingyun Zhang of Albany NY (US)
Ruilong Xie of Niskayuna NY (US)
Julien Frougier of Albany NY (US)
Ruqiang Bao of Niskayuna NY (US)
Prabudhya Roy Chowdhury of Albany NY (US)
MONOLITHIC STACKED FIELD EFFECT TRANSISTOR (SFET) WITH DUAL MIDDLE DIELECTRIC ISOLATION (MDI) SEPARATION - A simplified explanation of the abstract
This abstract first appeared for US patent application 20240113162 titled 'MONOLITHIC STACKED FIELD EFFECT TRANSISTOR (SFET) WITH DUAL MIDDLE DIELECTRIC ISOLATION (MDI) SEPARATION
Simplified Explanation
The abstract of the patent application describes a method for processing monolithic stacked field effect transistors with dual middle dielectric isolation separation. This involves forming two nanosheets stacked vertically, each with a gate around its channel region and a middle dielectric isolation structure between them.
- Formation of dual middle dielectric isolation separation in monolithic stacked field effect transistors
- Stacking of two nanosheets with gates around their channel regions
- Creation of a middle dielectric isolation structure between the nanosheets
- Structure includes two middle dielectric isolation layers stacked vertically
- Gate extends between the middle dielectric isolation layers
Potential Applications
The technology described in the patent application could have potential applications in:
- Semiconductor manufacturing
- Integrated circuits
- Nanoelectronics
Problems Solved
The technology addresses the following problems:
- Improving performance and efficiency of field effect transistors
- Enhancing isolation between stacked nanosheets
- Increasing density of transistors in a monolithic structure
Benefits
The technology offers the following benefits:
- Higher transistor density
- Improved transistor performance
- Enhanced isolation between transistors
- Potential for smaller and more efficient electronic devices
Potential Commercial Applications
The technology could find commercial applications in:
- Semiconductor industry
- Electronics manufacturing
- Mobile devices and computers
Possible Prior Art
One possible prior art in this field is the use of traditional dielectric isolation techniques in semiconductor manufacturing processes.
Unanswered Questions
How does this technology compare to existing methods for isolating stacked transistors?
The article does not provide a direct comparison between this technology and other methods for isolating stacked transistors.
What are the specific performance improvements achieved with this dual middle dielectric isolation structure?
The article does not detail the specific performance improvements achieved with the dual middle dielectric isolation structure.
Original Abstract Submitted
embodiments of the present invention are directed to monolithic stacked field effect transistor (sfet) processing methods and resulting structures having dual middle dielectric isolation (mdi) separation. in a non-limiting embodiment of the invention, a first nanosheet is formed and a second nanosheet is vertically stacked over the first nanosheet. a gate is formed around a channel region of the first nanosheet and a channel region of the second nanosheet and a middle dielectric isolation structure is formed between the first nanosheet and the second nanosheet. the middle dielectric isolation structure includes a first middle dielectric isolation layer and a second middle dielectric isolation layer vertically stacked over the first middle dielectric isolation layer. a portion of the gate extends between the first middle dielectric isolation layer and the second middle dielectric isolation layer in the middle dielectric isolation structure.