Intel corporation (20240113700). TECHNIQUES FOR DUTY CYCLE CORRECTION simplified abstract

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TECHNIQUES FOR DUTY CYCLE CORRECTION

Organization Name

intel corporation

Inventor(s)

Christopher P. Mozak of Portland OR (US)

Ralph S. Li of Portland OR (US)

Chin Wah Lim of Bayan Lepas (MY)

Mahmoud Elassal of King City OR (US)

Anant Balakrishnan of Hillsboro OR (US)

Isaac Ali of Folsom CA (US)

TECHNIQUES FOR DUTY CYCLE CORRECTION - A simplified explanation of the abstract

This abstract first appeared for US patent application 20240113700 titled 'TECHNIQUES FOR DUTY CYCLE CORRECTION

Simplified Explanation

The patent application describes a technique for measuring a duty cycle using a sample clock based on a prime number ratio of a reference clock frequency. The duty cycle error is determined and adjusted based on the measured duty cycle.

  • Using a sample clock to measure duty cycle
  • Periodic sampling of a target clock signal
  • Prime number ratio of reference clock frequency
  • Determining duty cycle error
  • Adjusting duty cycle based on error magnitude

Potential Applications

This technology could be applied in various industries such as telecommunications, electronics, and manufacturing where precise duty cycle measurements are required.

Problems Solved

This innovation solves the problem of accurately measuring duty cycles and adjusting them based on the error magnitude, leading to improved performance and efficiency in systems that rely on duty cycle control.

Benefits

The benefits of this technology include enhanced accuracy in duty cycle measurements, improved system performance, and increased efficiency in controlling duty cycles.

Potential Commercial Applications

Potential commercial applications of this technology include use in telecommunications equipment, electronic devices, and industrial machinery where precise duty cycle control is essential for optimal operation.

Possible Prior Art

One possible prior art could be the use of traditional clock signal sampling techniques for duty cycle measurement, which may not offer the same level of accuracy and efficiency as the method described in the patent application.

Unanswered Questions

How does this technology compare to existing methods for duty cycle measurement?

This article does not provide a direct comparison to existing methods for duty cycle measurement, leaving the reader to wonder about the advantages and disadvantages of this new technique.

What are the specific industries or applications that could benefit most from this technology?

The article does not delve into specific industries or applications that could benefit the most from this technology, leaving the reader curious about where it could have the most significant impact.


Original Abstract Submitted

examples may include techniques for using a sample clock to measure a duty cycle by periodic sampling a target clock signal based on a prime number ratio of a reference clock frequency. the reference clock frequency used to set a measurement cycle time over which the duty cycle is to be measured. a magnitude of a duty cycle error as compared to a programmable target duty cycle is determined based on the measured duty cycle and the duty cycle is adjusted based, at least in part, on the magnitude of the duty cycle error.